======================ANALOG_TERMS================================= algorithm rules with steps for solving a problem. alias frequency A falselowerfrequency component that appears digitized at an insufficiently high sampling rate. ambient level values of signals and noise that exist at a test location when the device under test is not active. anechoic chamber enclosure with walls that absorb sound radiation, creating free-field environment for testing. array An ordered arrangement of information. aspect ratio The width-to-height ratio of a video picture. asynchronous An action that takes place at an arbitrary time, without synchronization to a reference timer or clock. background take place without direct operator intervention; balun An antenna-balancing device matches a balanced or symmetrical load (a dipole antenna) to an unbalanced load (a coaxialcable feed line). ("Balun" is derived from "balanced-to-unbalanced.") blob region in image which all pixels same gray level. chrominance defines hue and saturation, but not the brightness cold-junction compensation artificial reference level that compensates for ambient temperature variations inthermocouple circuits. collimate To create a light beam in which all optical rays are parallel. composite syne video signal that contains horizontal sync pulses, vertical sync pulses, and equalizing pulses only, with a no-signal referencelevel. composite video composed of the luminance (black and white), chrominance (color), and a colorburst signal. blanking pulses, sync pulses, conducted emission Electromagnetic energy propagated along a conductor. called "conducted interference" if it is undesired. convolution mathematical operation that filters images. coprocessor A processor that operates with the CPU to boost speed. digital signal processing (DSP) chip can free the CPU from having to perform repetitious math counter (1) Insoftware, a memory location used to store a count of certain occurrences. (2) In hardware, a circuit that counts events. counterpoise The reference plane portion (grounded or ungrounded) of an unbalanced antenna. crosscoupling The coupling signal from one channel, to another, where it becomes an undesired signal. cross modulation Modulation of a desired signal by an ndesired signal. special case of intermodulation. crosstalk one or more signals interfere with another signal. current loop transmits data as current flow over relatively long distances and through environments with relatively high noise. data acquisition gathering infermation from sources such as sensors and transducers. decibel dB = 20 log V'ltage1/Powerl = 10 log V'ltage2 /Power, 1 €V dBm absolute powerlevel referred to 1 mW dBe level difference referred to a carrier level, c. dBcMz level difference referred to carrier level calculated for a measurement bandwidth of 1 Hz. decoupling-neCwork prevents test signals applied to the unit under test from affecting other devices, equipment, or systems that are not under test. degradation An unwanted change in the performance o degradation is not necessarily a malfunction or failure. devicedriver See driver. digital-to-analog conversion changes discrete values into a voltage digital-to-analog converter (DAC orD/Aconverter) converts digital information into analog voltage dipole antenna made of a straight conductor (usually not longer than half a wavelength) that is divided at its electrical center and connected to a transmission line. (DIVIA) direct memory access direct transfer information between computer's memory and device while computer's does something else. driver Software controls hardware device, dynamic range ratio full-scale range (FSR) to smallest difference the converter can resolve edge detection locates an edge by examining for abrupt changes (EMC) electromagnetic compatibility ability to operate in intended environment without creatinginterference with other equipment. eventcounter counts the occurrences false color Color added to an image to call attention to details that aren't readily perceptible far field region which power flux density from an antenna obeys the inverse-square law. feature any characteristic of an image or a region in an image. feature extraction technique generates set descriptors or characteristic attributes from a binary image. field set even or odd lines in interlaced video image. large open site which testing take place. field of view area of object under view a as represented at the focal plane of a camera. field strength measurement either electric or magnetic field in far field. (Expressed in units of V/m, A/m, or W/m.) filter selectively removes noise from a signal. Electronic filters include low-pass, band-pass, and high-pass types. firmware program permanently recorded in ROM; effectively hardware that performs software functions. flaw detection image-analysis examines for unwanted features of unknown shapes at unknown positions. floating-point numbers, in scientific notation, known as "real" numbers foreground In a personal computer, activity subject to direct operator intervention. Background activities running on computer simultaneously. frame the total area of the picture that scanned by a camera. frame grabber digitizes an image and stores it in a computer's memory. frame rate frequency which image completely updated on display front end Any preprocessor of information. signal conditioning in data-acquisition system takes place in a front end. Gaussian filter Gaussian curve, describes passband characteristics. graylevel brightness value assigned to pixel from black to white. gray scale discrete gray levels 8-bit system runs from 0 to 255. ground electrically neutral wire has same potential as earth. ground plane conducting surface or plate used as a common electrical reference point for circuits. (HD) harmonic distortion distortion in analog that generates harmonics total harmonic distortion (THD), ratio of the sum of multiple harmonics to the level of the original signal. hexadecimal base-l6 numbering system; 0-9, A-F. high-passfilter (1) A math operation that emphasizes details in an image. (2) A circuit that attenuates low-frequency components in an analog signal. histogram In inspection, the graphical representation of the gray scale values found in an image. horizonal blanking The blanking signal that occurs at the end of each video scanning line. horizontal sync The portion of a video signal that indicates the end of a line of video information. hue The distinction between colors. Red, blue, green, and yellow are examples of hues. White, black, and gray are not considered hues, because they are intensities, not colors. image analysis A technique that extracts features and descriptions from images. image processing Transforming a source image into an improved image that supplies specific properties. For example, edge detection is an image-processing method. immunity The property of equipment that enables it to reject an electrical disturbance. impulse An electromagnetic pulse of short duration--shorter than one cycle at the highest frequency being considered. input/output(I/O) The transferof data from or to a computer system. instrumentation amplifier (IA) An amplifier circuit with high impedance differential inputs and high common-mode rejection. intermodulation The mixing of two signals in a nonlinear device. This produces signals at frequencies that are the sum and difference of integral multiples of the original signals. See also cross modulation. interrupt A signal that requires immediate attention from a computer's CPU. interrupt handler The software routine that handles an interrupt's request for service. I/0 address A specific hardware circuit and software value that the CPU uses to distinguish betureen the different boards in a system. isolation amplifier An amplifier that provides electrically isolated inputs and outputs that let it amplify a differential signal that is superimposed on a high commonmode voltage. isolation voltage The voltage that an isolated circuit can normally withstand. Isolation voltage is specified from input to input or from any input to the amplifier output. isotropic Having properties that have equal value in all directions line In imaging,the coordinate that defines the vertical location of a pixel in an image. linearity Therelationship ofa device's response to a straight line. * * ^ * * Gain_Error * * * | * * \ * * * * * |Linearity _ _*_ \ * _ _ _ _ _ _v_ - - - - - - | ^ *_ _-__-_-_-_ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ | v ^ ^ | offset error codeN offset error | _____|__________________________V_________________|____ <---------%_of_max_code----> Total_errorcodeN=Offset_error+Gain_error*%_maxcode+Linearity_ErrorcodeN low-pass filter (1)An operation that blurs details in an image. (2) A circuit that attenuates the highfrequency components in an analog siffnal. macro A set of program steps combined by a user or a programmer that act as a single and more powerful program step. mismatch A nonideal coupling of two circuits. The part of the signal that does not pass through the coupling gets reflected and leads to measurement error. monochrome An image represented by a single color. Generally, a monochrome image is presented as white on a black background. monopole An antenna that consists of a straight conductor and is usually not more than one quarter of a wavelength long. A monopole is mounted immediately above, and at a right angle to, a ground plane. monotonicity A characteristic of a properly operating DAC in which the analog output increases as the digital code input to it increases. multiplexer (mux) A set of semiconductor or electromechanical switches arranged to select one of many inputs to a single output. A selector switch. noise Undesirable electrical interference to a signal. noise distortion he nonlinear behavior that circuits or devices exhibit when driven with a broadband noise signal NTSC (National Television System Committee) A 60-Hz standard for encoding color video signals. is used in North America, Canada, Japan, and most of South America. See also PAL, RS-170. Nyquist sampling A theorem that establishes a relationship between sampling rates and the ability to recreate the data that needs to be acquired. Nyquist's theorem states that if you sample a signal at rate f, the sampled signal will contain no information about signals with frequency components above f/2. open area An open and flat test site at which electromagnetic interference measurements are taken and at which effects from power wires, buildings, and underground cables are negligible. Ambient radiation must be low to permit testing. optical isolator A device that links two circuits through an optoelectronic transmitter and receiver with no direct electrical connection between the two circuits. PAL (phase alternation line) A 50-Hz composite color video standard in Western Europe, India, China, and some Middle Eastern countries. passive filter filtercircuit using only passive components such as resistors, capacitors, and inductors. pixel (1) The fundamental picture element in a digital image. (2) The coordinate unit used to define the horizontal location of a pixel in an image. ("Pixel" is an acronym for "picture element.") polarization The orientationof the field vector in a radiated field. polling Around-robin canvassing of inputs to a computer to determine which ones are active. In most cases, polling is synchronized in software to a clock or external trigger. port A communications connection on a computer or a remote controller. For example, an I/0 port. protocol The rules that govern the exact sequence of bits, bytes, and other information that travels between communication systems or computers. quantizing error The inherent uncertainty in digitizing an analog value thatcaused by the finite resolution of the conversion process. Increasing the resolution of an ADC reduces the uncertainty. (RFI) radio-frequency interference High-frequency interference with radio reception. range (1) The maximum allowable full-scale signal (input or output) that yields a specified performance level. (2) A large place in which measurements take place. region of interest In inspection, the area inside defined boundaries of an image that you want to analyze. repeatability The ability of an instrument to give the same output or reading under repeated identical conditions. resolution The smallest division to which a measurement can be determined. For example, an ADC with 12-bit resolution can resolve 1 part in 4096 over input range. RGB A video-display standard in which three separate signals-red, green, and blue-transmit image information. RS-170 The encoding standard for 60-Hz black-and-white television signals; it is used as the standard for most monochrome video equipment. See also NTSC, PAL. (S/H) sample and hold A circuit that acquires an analog voltage stores it temporarily in a capacitor. This circuit is also referred to as a sample-and-hold amplifier (SHA). SAMPLE_HOLD Sample Commmand | |<-----> Acquistion Time | | _ |_|_ _ /_\_ _ _ _ _ _ _ _ Specified Error Band |_|___/___\__--___________________ Final Value |_|_ _|_ _ \/ _ _ _ _ _ _ Specified Error Band | | | | | | <-- cap charging | | / |_|_/_____________________ ^ ^ Switching time delay (Aperture delay) Hold Commmand SAMPLE_HOLD | |<---> Hold mode settle Time | | |_____|__ _ _ _ _ _ _ _ _ _ Specified Error Band | | \ /\ _____________________ Final Value | |_ _\/_ -- _ _ _ _ _ _ Specified Error Band | | | | _ Start Convert Pulse |_____|___| |______________________ Seebeckeffect The principlethat describes how thermocouples work. A thermocouple circuit contains two junctions of two dissimilar metals. When the junctions are at different temperatures, a current flows. sensitivity A measure ofthe minimum change in an input signal that an instrument can detect. settling time The time required, after rapidly changing a circuit's input signal, for that circuit's output voltage to settle and remain within a specified error band around the final value. (SNR) signal-to-noise ratio The ratio of total signal to noise expressed in decibels (dB). The larger the number, the better. SNR is calculated by SNR = 201og SignalRMs /NoiseRMs A related unit is the signal-to-noise and distortion ratio (SINAD), the ratio of the input signal to the sum of noise and harmonics: SINAD 201og SignalRMs /(Noise + Harmonics)RMs simultaneous sample and hold A data-acquisition technique in which several sample-and-hold circuits sample several different analog channels simultaneously. spike A transient disturbance of an electrical circuit caused by, for example, load variations on AC power line. stability The ability of an instrument or sensor to maintain consistent output when constant input applied. subpixelresolution Any imaging technique that can yield a measurement with spatial resolution less than one pixel. successive- approximation A technique used in ADCs that sequentially compares a series of progressive r binary-weighted values with €i analog input to produce an output digital word. surge Asuddenchange (usually an increase) in the voltage on a power line. A surge is similar to a spike,butitlastslonger. susceptibility The characteristic of electronic equipment that permits undesirable responses when the equipment is subjected to electromagnetic radiation. sync Theportionofavideo signal that indicates either the end of a field or a line of video information. throughputrate The maximum repetitive rate at which a data-conversion system can operate with a specified accuracy. time stamp Information added to a unit of data to indicate the time at which it was processed. total harmonic distortion (THD) See harmonic distortion. vertical sync The portion of a video signal that indicates the end of a field of video information. sync pulse is used by video equipment to maintain field synchronization with the incoming video signal. video encoder A device that converts RGB video to composite video. (VFC) voltage-to-frequency converter converts an analog input voltage into a sequence of digital pulses with a frequency that is proportional to the input voltage. T&MW Anode: the cell plate, or electrode, at which an oxidation reaction occurs. A cellL negative electrode is an anode when the cell is discharging, but a cathode when it is being charged. Possibly, ther€re, the terms "positive" and "negative" may be more useful in identifying electrodes. Battery: two or more cells connected to form a single unit. (Since contemporary usage allows for oneiell batteries, the terms Ucell" and "battery" are sometimes used interchangeably.) C-rate: a rate of charge or dixharge in amperes numerically equal to the capacity of the battery in amperehoun. Multiples and submultiples of the C-rate are commonly used. For example, the specific energy of a battery is often specified for discharges at U3 rate. Cathode: the cell plate, or electrode, at which a reduction reaaion occurs. A cell's positive electrode is a cathode when the cell is discharging, but an anode [see above] when it is being charged. Cell: an electrochemical energy-storage device consisting of two electrodes, or plates; an electrolyte; and (usually) a se€rator. Electrolyte: the ionic conductor, typically a liquid, that provides internal connection between plates of cell. The electrolyte must not be an electronic conductor lest it short-circuit the cell. Life: the totai iength of time that a battery will operate before it needs to be replaced. For primary battefies, it is expressed in hours- of actual use; for rechargeable units limiting factor is the number of months or years since the battery vvas manufactured or number of charge-discharge €s to which,it has been su€€,€le:l€ EnerSV density: storage.density of a battery, many expressed in watt-hour per liter. Float charging: The practice of keeping a storage battery ready b€ use by means of a contlnuous, long-term constant-voltage, limited current charging regime. Memory € the reduction in capacity of a nikkel-cadmium €€ due.:to repeated partial discharge-charge cycles. Power density the volumetric power density of a battery, usually expressed in watts per liter. Primary cell: a cell that can be discharged only once. Secondary cell: a rechargeable celi. Separator: a nonconductive €i€:-:€rous material inserted beh€veen,the -€ates of a cell to keep them from shorting together. Although €self nonconductive, the sepa€or must be permeabli to the el€lyte solution so that ionic conductivity is: maintained.b€n the plates. Specifk energy: the gravimetric energy storage density of:a b€ery. €ally expressed in watt-houn per kilogram. S€ecific power: the g€vi€ic €rdensity of a battery, usually expre€d in watts per kirogram. Voltage Comparator Definition of Terms Input Current (IB): average of the two input currents. Input Offset Current (IOS): difference currents between two input terminals. Input Offset Voltage (VOS): DC voltage must applied between input terminals to force DC output to stay at mid-point between positive and negative supplies. Input Voltage Range (VCM): Typically the range of voltages on the input terminals for which the comparator?s performance is specified. Logic Threshold Voltage: The voltage that exceeds the input offset voltage causing the output to change state. Offset Voltage Temperature Coefficient (TCVOS): The average rate of change in offset voltage for junction temperature variation over a specified temperature range. Offset Current Temperature Coefficient (TCIOS): The average rate of change in offset current for junction temperature variation over a specified temperature range. Output High Voltage (VOH): The high DC output voltage with output driven high with specified output current. Output Low Voltage (VOL): The low DC output voltage with the output driven low with specified sinking current. Output Leakage Current: The current into the output terminal with the output driven high. Output Resistance: The apparent output resistance of a comparator, typically illustrated with an ideal comparator with zero output resistance in series with an output resistor, Rout, measured under DC conditions. Output Sink Current: The maximum negative current that can be sunk by the comparator. Output Source Current: The maximum positive current that can be sourced by the comparator with push/pull output state. Power Consumption: power required comparator with no output load. Response Time: The interval between the application of an input step function and the time when the output crosses the logic threshold voltage. Saturation Voltage: The low DC voltage of an open collector output with the output driven low with specified sinking current. Strobe Current: The current out of the strobe terminal when it is at the zero logic level. Strobe Output Level: The comparator DC output voltage, independent of input conditions, when the strobe is active. Strobe "ON" Voltage: The maximum voltage on strobe terminal required forcing the output to the specified high state independent of the input voltage. Strobe "OFF" Voltage: The minimum voltage on the strobe terminal that will guarantee that it does not interfere with the operation of the comparator. Strobe Release Time: The time required for the output to rise to the logic threshold voltage after the strobe terminal has been driven from zero to a logic one level and the input is at a level that would drive the output low. Supply Current: The current required from the positive or negative supply to operate the comparator with no output load. Voltage Gain: The ratio of the change in output voltage to the change in voltage between the input terminals producing it. Voltage overdrive: The input step voltage that goes beyond the minium drive required to change the output state from one logic level to the opposite logic level. Absolute Accuracy: worst case input to output error of a data converter referred to the NIST standard volt. Accuracy: measured value with its true value; the maximum error of from the true value. See relative accuracy and absolute accuracy. Acquisition Time: required to acquire a new analog input voltage once a sample command has been given. "acquired" when settled within a specified errorband around final value voltage. maximum value acquisition time when hold capacitor change tofull scale voltage change. acquisition time not just time required for settle, includes time for all internal nodes to settle so output assumes proper value when switched to hold mode. Aperture Jitter (or Aperture Undertainty) : range variation in aperture time. Aperture Time time it takes from when Hold command is given to sample and hold circuit until switches from sample mode to hold mode. Auto-Zero stabilization circuit servos an amplifier or A/D converter input offset to zero during operating cycle. Binary Coded Decimal (BCD): A binary code used to represent decimal numbers each digit 0 to 9 is represented by four bits weighted 8-4-2-1. Only 10 of the 16 possible states are used. Bipolar or Unipolar Inputs: A unipolar input is an input that will only accept and measure either positive and negative voltages (input voltage can not swing past 0). A bipolar input is an input that will except and measure both positive and negative voltages. usually means on a 12 bit system you only have 11 bits of resolution (11 bits + sign = 12 bits). And volia the 13-bit A/D converter was born. (12 bits + sign) Clocks, Internal/External : All A/D converters need of clock . This clock can either be external or internal. Internal saves you some external components, external allows you to determine how fast things run (and how much power is consumed) Common-Mode Rejection Ratio (CMRR): For an amplifier, the ratio of differential voltage gain to common-mode voltage gain, generally expressed in dB. CMRR = 20 log(10)(AD/CM) Where AD is differential voltage gain and ACM is common mode voltage gain. Conversion Time: The time required for the converter to perform the conversion. This is contrasted with acquisition time, which is the time to acquire, or grab, the signal voltage at a given point in time. Conversion Rate: The number of repetitive A/D or D/A conversions per second for a full scale change to specified resolution and linearity. DC Common-Mode Error: This specification applies to A/Ds with differential inputs. It is the change in the output code that occurs when the analog voltages on the two inputs are changed by and equal amount. It is expressed in LSBs. Dielectric Absorption: A voltage memory characteristic caused by the dielectric material not polarizing instantaneously. The result is that not all the energy stored in a charged capacitor can be quickly recovered upon discharge, and the open capacitor voltage will creep back up. Differential Input: Usually inputs are referenced with respect to some Vref (usually high - some other input pin or Vcc) and ground. On an 8-bit system, if Vref = 5V and the input measured was 4.000V the output would be (256steps/5V * 4.000V) = 204d (11001100b). With a differential input the difference between two inputs is given. On the same system, a differential measurement is taken between two inputs, the first at 4.0000V, the second at 3.5000V, the output would be (256step/5volts * (4.0000V - 3.5000V) ) = 25d (0001001b). (The opposite of differential is single-ended) Differential Nonlinerarity Error (DNL): Differential Nonlinearity is a measure in the error of the step size. The ideal step size is one LSB. If the highest step size in a given conerter is 1.8LSB, the the maximum error, or DNL, is 0.8LSB. A DNL greater than 1.0 LSB can lead to missing codes in an ADC (not necessarily WILL lead to missing codes) and CAN lead to a non-monotonic transfer function in a DAC. Differential Linearity Tempco: The change in differential linearity error with temperature for a data converter, expressed in ppm/deg C of FSR (Full Scale Range) Drive, LCD/LED : Some A/D chips are designed specifically for Digital Volt Meters (DVM). The device does the conversion, and the BCD to Seven Segment decoding - all on the same chip. Droop Rate: rate which output voltage changing in hold mode as result to leakages within sample-and-hold circuit. sample-and-hold system, rate (in volts per second) Dynamicsampling error error introduced intoheld output due to a changing analog input at time hold command is given. expressed mV with hold capa value and input slew rate. this error term occurs even for long sample times. Dynamic Specs: specifications of an A/D pertaining to an AC input signal.included S/N (Signal to Noise) ration, SINAD (Signal-to-Noise + Distortion Ratio), ENOB (Effective Number of Bits), THD (Total Harmonic Distortion), IMD (Intermodulation Distortion), FPBW (Full Power Bandwidth), and SSBW (Small Signal Band Width). (ENOB): Effective Number of Bits measurement SINAD from equa : ENOB= (SINAD - 1.76) / 6.02. specification combines effects of other dynamic spec; errors from dynamic differential and integral nonlinearity, missing codes, THD, aperture jutter shown. Feedthrough Attenuation Ratio: fraction input signal that appears at output while sample and hold in hold mode. FIFO (First In - First Out): describes size of buffer on serial or parallel transmission ,can make conversion,put value in FIFO, and wait until processor is read before sending information. FullPowerBandwidth (FPBW): While full power bandwidth is epecified differently from manufacturer to manufacturer frequency at which the output response falls by 3dB f Full Scale Error difference (usually expressed in LSBs) between A/D input voltage that ideally produc full scale output and actual input voltage produces that code; Full Scale Range (FSR): The difference between maximum and minimum analog values for an A/D converter input or A/D converter output. Gain Error the deviation of the slope of the input/output transfer characteristic its ideal slope. Gain Temperature Coefficient (Full Scale Temperature Coefficient) Change gain error divided by change temp. expressed in parts per million per degree Celsius (ppm/C). Hold Capacitor Leakage Current: Leakage currents through S/H circuitry cause unwanted discharge, or charge, ocapacitor in hold mode. what causes the Droop Rate. Hold Settling Time time required for the output to settle within a specified error band after "hold" logic command given. Hold Step voltage step at output of S/H when switching from sample to hold mode with steady (DC) analog input voltage IntegralNonlinearity (Linearity Error): Worst Case deviation of an ADC or DAC transfer between endpoints (zero and full scale).as a percentage of full scale or fractions LSB. (IMD): Intermodulation Distortion Two frequency components interact through nonlinerarities to produce signal a additional frequencies. IMD defined as ratio of rms sum of distortion product amplitudes to rms sum input freqy Linearity Error Integral Linearity Error and Differential Linearity Error. Long Term Stability variation in data converter accuracy due time alone. commonly specified percent per 1000 hours or per year. Low voltage: Most A/Ds are require 5 or 15 volts as Vcc. some A/Ds on less (3.3 and lower) LSB (Least-Significant Bit): binary systems the bit that carries smallest value or weight. full scale voltage divided by 2^n, where n is resolution of the converter. Major transition change from a code of 1000...000 to 0111...111 or vice-versa. transition most difficult from linearity standpoint since MSB weight must be precisely one LSB larger than sum all other bit weights. Missing Codes: If there are missing codes, digital codes cannot be reached by input voltage value. Monotonicity slope whose sign does not change. MSB (Most Significant Bit):binary coded system bit that largest value or weight. one half of full scale. Multiplexer: gives the A/D the ability to sample 8-channels with only one A/D block inside. bank of switches let one input through to A/D block at one time. system - you must convert one channel at a time NormalModeRejection attenuation of specific frequency or band of frequencies directly across two electrical terminals. normal mode rejection determined by input filter or by integration of the input signal. Nyquist Frequency maximum sampling frequency (Fs) required to resolve maximum input frequency (Fin). sampling freq should be two times the maximum input frequency (Fs=2Fin). Offset Drift: change with temperature analog zero for data converter operating in bipolar mode. expressed in ppm/deg C of FSR. Offset Error (Zero Error): difference between ideal voltage (1/2 LSB) and actual input voltage needed to transition from zero to 1 LSB. All codes in transfer curve are offset by same value. Offset Error is usually expressed in LSBs. Output Logic Levels Defines the voltage and current output characteristics can TTL, CMOS, TRI-STATE, or Open Collector. Peak Harmonic: The amplitude, relative to the fundamental, of the largest harmonic resulting from the A/D conversion of a AC signal. Powersupplyrejection Power Supply Sensitivity The sensitivity of a converter to changes in the dc power supply voltages. Quantizing Error error inherent in all A/D conversions. "ideal" converter has finite resolution, analog voltage ts between two adjacent output codes result in output code inaccurate by up to 1/2 LSB. RatiometricOperation A/D applications references for signal source should be connected to reference of converter. T variations in source reference voltage change converter reference produce accurate conversion. Relative Accuracy: worst case error of a data converter, percent of full scale, referred to converter reference consists of offset, gain and linearity components. Resolution: smallest analog incrementto a 1 LSB converter code change.resolution normally expressed in bits, number of digital codes equal to 2^n. Sample-to-Hold Transient: transient at the output due to a sample-to-hold transition. Settling Time time fromchangeinput code until a DAC's output within +/- 1/2 LSB ( of the final value. (S/N Ratio, SNR): Signal-to-Noise Ratio ratio signal amplitude to background noise level background noise determined by integrating noise spectral density over bandwidth of SINAD (Signal-to-Noise + Distortion Ratio): Similar to S/N includes harmonic distortion components as part noise. Self Calibrating: will go through a self-adjusting cycle that adjust for zero, full scale, linearity errors. Serial I/O UART - A UART (Universal Asynchronous Receiver Transmitter) is a serial port adapter for asynchronous serial communications. USART A USART (Universal Synchronous/Asynchronous Receiver Transmitter) serial port adapter either asynchronous or synchronous serial communications.using synchronous mode are typically much faster ( 16 times) than asynchronous mode. Synchronous serial port - A synchronous serial port doesn't require start/stop bits can operate much higher clock rates asynchronous serial port. A few common types of synchronous serial communication protocols are: SPI (Motorola) SPI (serial peripheral interface) is a synchronous serial port. I2C bus Inter-Integrated Circuit bus (Philips) - The I2C bus is 2 wire serial interface developed by Philips. It was 8 bit applications and is widely used in consumer electronics, automotive and industrial applications. MICROWIRE & MICROWIRE/PLUS (National Semiconductor) - MICROWIRE is serial synchronous bi-directional communications int MICROWIRE/PLUS has some enhancements that are MICROWIRE. (SSBW): Small Signal Bandwidth frequency which S/N ratio dropped 3dB (relative to its low freq for input signal much smaller than full scale input (20dB or 40dB below full-scale, r example). Static Specifications The specifications of A/D pertaining to DC signal include gain error, offset error,differential/integral linearity errors. Supply: Denotes the required power supply(ies). Temperat Coefficient: change in analog magnitude with temperature, expressed in ppm/deg C. Throughput Time time is takes from addressing analog input channels till valid data read on output. some systems (such as National's LM12454/8 DAS )includes sequencer instruction, selecting properinput channels and waiting settle, conversion time of A/D, storing results in FIFO, sending data request, one clock cycle forread to occur. Throughput rate inverse of the throughput time. (THD): Total Harmonic Distortion inherent nonlinearities ideal A/D , A/D's produce harmonics of the input frequency. THD the ratio of the rms sum of harmonic distortion product amplitudes toinput signal amplitude. (TUE): Total Unadjusted Error maximum deviation ofvoltage to center of a digital code's associated input voltage span fromideal case. includes offset error, gain error, and differential nonlinearity errors. Track and Hold: If a A/D has a track an hold, does not require an external Sample and Hold. The functionality is the same of a sample and hold Voltage Reference: Every accurate A/D system **must** have a rock solid voltage reference. output of A/D is dependenttwo inputs - inputmeasured andvoltage reference.Garbagein-Garbage out).Howeverratiometic measurements tolerate variation in reference voltage. system problems on A/D can be to either noisy Vref, varies with temperature, spikes, etc. Watchdog Mode: used to monitor an input's condition. interrupt signal generated if input matches preset condition. watchdog mode provide quick and accurate assessment of possible alarm condition. ======================ELECT_TERMS=================================== ACTIVE FILTER electronic filter combines active circuit with R and C ALGORITHM set rules for solving a problem. ALIAS FREQUENCY false lower frequency component appears in analog data reconstructed from original data digitized at insufficiently high sampling rate. AMBIENT LEVEL values signals and noise exist at test location when device under test is not active. AMPLITUDE MODULATION The process in which the amplitude of a carrier wave is varied according to a specific law. ANALOG-TO-DIGITAL CONVERSION The process that changes an analog signal into a digital magnitude value. ANALOG-TO-DIGITAL CONVERTER (ADC orA/D converter) circuit producesa digital directly proportional to analog signal input. ANECHOIC CHAMBER enclosure especially designed with walls that absorb sound or radiation, creating free-field environment for testing. ANTENNA device that radiates or receives radio waves. AREA ANALYSIS image-analysis technique that finds the area in an image that falls within range of specific gray levels. ARRAY ordered arrangement of information. ASPECT RATIO width-to-height ratio of a video picture. ASYNCHRONOUS action that takes place at an arbitrary time, without synchronization to a reference timer or clock. AVERAGING Mathematically smoothing results of several measurements by adding them and dividing by the number of samples. BACKGROUND programmed operations that take place without direct operator intervention; BALUN antenna-balancing device that matches a balanced or symmetrical load (a dipole antenna) to unbalanced load (a coaxialcable feed line). ("Balun" is derived from "balanced-to-unbalanced.") BAND-PASS FILTER filter that passes only those signal frequencies between two set frequencies. BIPOLAR (1) signal that includes positive and negative values. (2) A type of semiconductor BLOB connected region in image which all pixel same gray BRIGHTNESS value associated with a pixel that represents a gray value between black and white. BROADBAND EMISSION emission has spectral energy distribution is sufficiently broad, uniform, and continuous to ensure measuring receiver's response does not vary significantly over a given frequency range. CHROMINANCE color part of a video signal that defines the hue and saturation, but not the brightness or luminance, COLD-JUNCTION COMPENSATION An artificial reference level that compensates for ambient temperature in thermocouple circuits. COLLIMATE create light beam which all optical rays are parallel. COMMON-MODE REJECTION RATIO (CMRR) instrument's ability to reject interference from a signal is common to instrument's input terminals, but relative to ground. COMPOSITE SYNC video signal that contains horizontal sync pulses, vertical sync pulses, equalizing pulses only, with a no-signal referencelevel. COMPOSITE VIDEO composed of luminance (black and white), chrominance , blanking pulses, sync pulses,colorburst CONDUCTED EMISSION Electromagnetic energy propagated along conductor. energy called "conducted interference" if undesired. CONTRAST measure of brightness content in an image. High contrast implies mainly dark-black and bright-white content; low contrast implies a small spread of gray values. CONVERSION TIME time required from the moment a channel is interrogated to moment accurate data available. CONVOLUTION mathematical operation that filters images. COPROCESSOR processor that operates with the CPU to boost speed. For a digital signal processing (DSP) chip free CPU from repetitious math operations. COUNTER (1) software, a memory location used to store a count of certain occurrences. hardware, that counts events. COUNTERPOISE reference plane portion (grounded or ungrounded) of an unbalanced antenna. CROSS COUPLING coupling of a signal from one channel, circuit, or conductor to another, an undesired signal. CROSS MODULATION Modulation of a desired signal by an undesired signal. This is a special case of intermodulation. CROSSTALK phenomenon in which one or more signals interfere with another signal. CURRENT LOOP communications method that transmits data as current flow over long distances through environments with relatively high noise. DATA ACQUISITION Gathering infermation from sources such as sensors and transducers. DECIBEL logarithmic measure of the ratio of two signal levels: dB = 20*log(Voltage1/Voltage2) = 10*log(Power1/Power2), Variants on the decibel(dB) 1 V dBm absolute powerlevel referred to 1 mW DBe LEVEL difference referred to a carrier level, c. DBcHZ LEVEL Difference referred to carrier level calculated for a measurement bandwidth of 1 Hz. decoupling-neCwork circuit that prevents test signals applied to unit under test from affecting other devices, equipment, or systems not under test. degradation Anunwanted change in the performance not necessarily a malfunction or failure. digital-to-analog conversion The process the changes discrete values into a voltage or current. DIGITAL-TO-ANALOG CONVERTER (DAC orD/Aconverter) A device that converts digital information into analog DIPOLE antenna made of a straight conductor (not longer than half a wavelength)divided at its electrical center and connected to a transmission line. DIRECT MEMORY ACCESS (DIVIA) direct transfer of information between computer's memory and a device while computer's CPU does something else. DRIVER Software controls specific hardware device, such as a data-acquisition board or a printer. DYNAMIC RANGE ratio full-scale range (FSR) of a data converter to smallest difference can resolve. (Dynamic range is generally expressed in decibels.) EDGE DETECTION locates an edge by examining an image for abrupt changes in pixel values. ELECTROMAGNETIC COMPATIBILITY (EMC) ability of electronic equipment to operate in environment without degradation caused by interference. ability equipment to operate without creating interference eventcounter circuit that counts occurrences of a certain condition. . FALSE COLOR Color added to an image to call attention to details that aren't readily perceptible or to create special effects. FAR FIELD region in which the power flux density from an antenna obeys the inverse-square law. For dipole distances beyond h/2 are far-field regions. FEATURE characteristic of an image or a region in an image. FEATURE EXTRACTION inspection, a technique that generates a set of descriptors or characteristic attributes from binaryimage. FIELD set either even or odd lines in interlaced video image. concept of field used when dealing with interlaced video display. large open site which testing take place. FIELD OF VIEW area of the object under view as represented at the focal plane of a camera. FIELD STRENGTH measurement of either the electric field or the magnetic field that is made in the far field. (Expressed V/m, A/m, or W/m.) FILTER selectively removes noise from a signal. include low-pass, band-pass, and high-pass types. Mathematical filters operate on data extract information enhance images. FIRMWARE program permanently recorded in ROM; it is effectively a piece of hardware that performs software functions. FLAW DETECTION image-analysis technique that examines an object for unwanted features of unknown shapes at unknown positions. FLOATING-POINT NUMBERS Numbers that contain decimal parts or are presented in scientific notation They are also known as "real" numbers. FOREGROUND the activity subject to direct operator intervention. Background activities running on computer simultaneously. FRAME total area of the picture that is scanned by a camera. FRAME GRABBER device that digitizes an image and stores it in a computer's memory. FRAME RATE frequency at which an image is completely updated on a display monitor. FRONT END preprocessor of information. GAUSSIAN FILTER filter for which a Gaussian curve, or bell curve, describes the passband characteristics. GRAY LEVEL brightness value assigned to a pixel; values range from black, through gray, to white. GRAY SCALE discrete gray levels that are defined for an imaging system or imaging software. 8-bit system, gray runs from 0 to 255. GROUND electrically neutral wire that has the same potential as surrounding earth. Normally, non-current-carrying c intended for safety. common reference point for an elect system. GROUND PLANE conducting surface or plate used as a common electrical reference point for circuits. HARMONIC DISTORTION (HD) A form of distortion in analog circuits that generates harmonics (signals whose frequencies integer of input signal).calculated as ratio of a single harmonic to level of the original signal. is related to total harmonic distortion (THD), ratio of sum of multiple harmonics to the level of the original signal. HEXADECIMAL base-l6 numbering system; 0-9, A-F. HIGH-PASSFILTER math operation that emphasizes details in an image. circuit attenuates low-frequency components in analog signal. HISTOGRAM graphical representation of the gray scale values found in an image. HORIZONAL BLANKING blanking signal that occurs at the end of each video scanning line. HORIZONTAL SYNC portion of a video signal that indicates the end of a line of video information. HUE distinction between colors. Red, blue, green, yellow are examples of hues. White, black, gray not hues, because they are intensities, not colors. IMAGE ANALYSIS technique extracts features and descriptions from images. IMAGE PROCESSING TRANSFORMING a source image into an improved image that supplies specific properties. IMMUNITY property of equipment that enables it to reject an electrical disturbance. IMPULSE electromagnetic pulse of short duration-shorter than one cycle at the highest frequency being considered. INPUT/OUTPUT(I/O) transfer of data from or to a computer system. INSTRUMENTATION AMPLIFIER (IA) An amplifier circuit with high impedance differential inputs and high common-mode rejection. INTERMODULATION mixing of two signals in a nonlinear device. This produces signals at frequencies are sum and difference of integral multiples of original signals. INTERRUPT signal requires immediate attention from computer's CPU. INTERRUPT HANDLER software routine that handles an interrupt's request for service. I/0 ADDRESS specific hardware circuit and software value that the CPU uses to distinguish betureen different boards in system. ISOLATION AMPLIFIER amplifier that provides electrically isolated inputs and outputs it amplify a differential signal superimposed on a high commonmode voltage. ISOLATION VOLTAGE voltage that an isolated circuit can normally withstand. Isolation voltage specified from input to input any input to the amplifier output. ISOTROPIC Having properties that have equal val LINE the coordinate that defines the vertical location of a pixel in an image. LINEARITY relationship ofa device's response to a straight line. LOW-PASS FILTER operation that blurs details in an image. attenuates the high frequency components in an analog siffnal. MACRO set of program steps combined bya user or programmer that act as a single and more powerful program step. MISMATCH nonideal coupling of two circuits. part of signal that does not pass through coupling gets reflected and leads measurement error. MONOCHROME An image represented by a single color. Generally, a monochrome image presented white on black background. MONOPOLE antenna that consists of a straight conductor usually one quarter of a wavelength long. A monopole is mounted immediately above, at right angle to, a ground plane. MONOTONICITY characteristic of a properly operating DAC in which the analog output increases as digital input to increases. MULTIPLEXER (mux) set of semiconductor or electromechanical switches arranged to select one of many inputs. NOISE Undesirable electrical interference to a signal. NOISE DISTORTION nonlinear behavior that circuits or devices exhibit when driven with a broadband noise signal. NTSC (National Television System Committee) 60-Hz standard for encoding color video signals. used in North America, Canada, Japan, and most of South America. NYQUIST SAMPLING THEOREM theorem establishes a relationship between sampling rates and ability to recreate data Nyquist's theorem states you sample a signal at rate f, sampled signal contain no information with frequency components above f/2. OPEN AREA open and flat test site which electromagnetic interference measurements are taken at which effects from power wires, buildings, and underground cables are negligible. Ambient radiation must be low enough to permit testing. OPTICAL ISOLATOR device that links two circuits through an optoelectronic transmitter and no direct electrical connection between two circuits. PAL (phase alternation line) 50-Hz composite color standard used Western Europe, India, China, Middle Eastern PASSIVE FILTER filtercircuit using only passive components such as resistors, capac PIXEL fundamental picture element in a digital image. (2) coordinate unit used define horizontal location ("Pixel" is an acronym for "picture element.") POLARIZATION orientation of the field vector in a radiated field. POLLING Around-robin canvassing of inputs to determine which ones are active. most cases, polling synchronized in software to a clock or external trigger. PORT communications connection on computer or remote . PROTOCOL rules that govern exact sequence of bits, bytes, and other information between communication systems or computers. QUANTIZING ERROR inherent uncertainty in digitizing an analog value that is caused by finite resolution of conversion process. Increasing resolution of an ADC reduces uncertainty. RADIO-FREQUENCY INTERFERENCE (RFI) High-frequency interference with radio reception. RANGE (1) maximum allowable full-scale signal (input or output) that yields a specified performance level. large place in which measurements take place. REGION OF INTEREST In inspection, the area inside defined boundaries of an image that you want to analyze. REPEATABILITY ability of an instrument to give same output or reading under repeated identical conditions. RESOLUTION smallest division which can be determined RGB three separate signals-red, green, and blue-transmit image information. RS-170 encoding standard for 60-Hz black-and-white television the standard for most monochrome video (S/H) SAMPLE AND HOLD acquires an analog voltage and stores it temporarily in a capacitor. as a sample-and-hold amplifier (SHA). SEEBECK EFFECT two junctions of two dissimilar metals. at different temperatures, a current flows. SENSITIVITY minimum change in an input signal that an instrument can detect. SETTLING TIME time required for that circuit's output to settle within a specified error band around the final value. (SNR) SIGNAL-TO-NOISE RATIO ratio total signal to noise in decibels (dB). The larger the number, the better. by SNR = 20*1og(SignalRMs /NoiseRMs). A related unit is the signal-to-noise and distortion ratio (SINAD) ratio of input signal to the sum of noise and harmonics: SINAD = 20*1og(SignalRMs /(Noise + Harmonics)RMs) SIMULTANEOUS SAMPLE AND HOLD A data-acquisition technique in which several sample-and-hold circuits sample several analog channels simultaneously. SPIKE transient disturbance of electrical circuit caused by, example, load variations on the AC power line. STABILITY ability of an instrument or sensor to maintain a consistent output when a constant input is applied. SUBPIXEL RESOLUTION Any imaging technique that can yield a measurement with a spatial resolution of less than one pixel. SUCCESSIVE- APPROXIMATION ADCs that sequentially compares progressive smaller binary-weighted values analog input to produce an output digital word. SURGE sudden change in voltage on power line. A surge is similar to a spike, but it lasts longer. SUSCEPTIBILITY electronic equipment that permits undesirable responses when the equipment is subjected to electromagnetic radiation. SYNC portion of video signal indicates either end of field or a line of video information. THROUGHPUT RATE maximum repetitive rate which a data-conversion system can operate with a specified accuracy. TIME STAMP Information added to a unit of data to indicate time at which it was processed. TOTAL HARMONIC DISTORTION (THD) See harmonic distortion. VERTICAL SYNC portion of a video signal that indicates the end of a field of video information. sync pulse used to maintain field synchronization with incoming video . VIDEO encoder A device that converts RGB video to composite video. (VFC) VOLTAGE-TO-FREQUENCY CONVERTER converts an analog input voltage into digital pulses with frequency that is proportional to the input voltage. active filter electronic filter operational amplifiers, with resistors and capacitors. Typically, active filters alias frequency false lower frequency component insufficiently high sampling rate. ambient level values of signals and noise that exist at test location when DUT not active. amplitude modulation amplitude of carrier wave is varied analog-to-digital conversion changes analog signal into digital value. anechoic chamber An enclosure especially designed with walls A/D analog-to-digital ADC analog-to-tligital conver€ter ADPCM adaptive differential pulse-code modulation AFC automatic frequency control AGC automatic gain control AHDL analog hardware descriptive language AMLCD active-matrix liquid crystal display ANSI American National Standards Institute AOI automated optical inspection AQL acceptable quality level ARET accelerated l€eliability enhancement testing ARINC Aeronautical Radio Inc. ASCII American (National)Standard Code Information Interchange ASQC Amel€ican Society of Quality Control ATE automatic test equipment ATG autornatic test generation ATM asynchponous transfer mode ATPG automatic test program (or pattern) generator AWG l)American wire gauge 2) arbitrary waveform generator balun balanced-to-unbalanced transformer BDD binary decision diagram BER bit error rate BERT bit error rate tester BGA ball-grid array B-ISDN broadband inteffrated sey€vices digital network BIST built-in self-test BIT built-in test BITE built-in test equipment BNC baby "N" connector BPSK binary phase-shift keying BS boundary scan BSDL Boundary-Scan Description Language CAD computer-aided design CAE computer-aided engineering CAMAC I computer-automatecl measurement and control CAT computer-aided test CCD charge-coupled device CCITT I Consultative Committee Intern Telephone and Telegraph CDMA I code division multiple access CFC 1) current-to-frequency converter 2) chlorofluorocarbon CIIL Common Instrument (Control Intermediate) Interface Lang CMR common-mode rejection CMRR common-mode rejection ratio C1MV common-mode voltage CMVR common-mode voltage ratio CODEC coder-decoder COTS commercial off-the-shelf cps cycles per second CPS characters per second CPU central processing unit CRC c3iclic redundancy check CSMA/CD carrier sense multiple access/collision detection CW continuous wave D/A digital-to-analog DAC tliRital-to-analog converter DAQ data acyuisition DAS data-accluisition system dB decibel dBm clK power(l mW into a 600-€lload) DBPSK differential-binary phase-shift keying DC direct current DCE tlata communications eyuipment DCT discrete cosine transform DDE dynamic data exchange DDS direct digital synthesis DFM clesiffn for manufacturability DFT 1) desiffn for test 2) tliscrete Fourier transform DIN Deutsche Industrie Normenausschuss German standards a DIG digital input/output DIP dual in-line package DLL dynamic link library DR€IA direct memory access D€M dig€ital multimeter DNL differential nonlinearity DPM digital panel meter DQPSK differential quadrature phase-shift keying DRAM dynamic random access memory DSO digital sampling (or storage) oscilloscope DSP diffital signal processoy€ (or processing) DTE data terminal equipment DTMF dual-tone multiple fi€eyuency DUT device under test DVM digital voltmeter EDA electronic design automation EDIF Electronic Design Interchange Format ELA Electronic Industries Association EISA extended industry standard architecture PC bus) EMC electromagnetic compatibility EMF electromagnetic field EMI electromagnetic interference EMF electromagnetic pulse E0 electro-optical, electro-optic EPLD erasable pl-offrammable logic device EPROM erasable pl€ogrammable read-only memory ESD electrostatic discharge ESDA electronic system design automation ESR equivalent series resistance ESS 1) environmental stress screening 2) electianic switching system ETS equivalent time sampling EUT equipment under test FCC Federal Communications Commission FDDI fiber distributed data interface FDMA frequency-division multiple access FET field-effect transistop FFT fast Fourier transform FIFO first-in,first-out FIR finite impulse response (filter) FIT 1) fault isolation test 2) failures in time (testing-) FM fi-equency modulation FPGA field-progr€ammable gate array FS full scale FSK frequency-shift keying FN frequency-to-voltaffe FTP File €ansfer Protocol(Internet) GFSK Gaussian fr€eyuency-shift keying GIF graphic image file GRISK Gaussian-filtered minimum-shift keying GPIB general purpose interface bus GPS Global Positioning S;ystem GSM GY€oupe Speciale Mobile (or Global System for Mobile ('ommunications) GUI graphical user interface HALT highl3' accelerated life test HASS highly accelerated stress screening HAST highly accelerated stress test HEM human body model HF high heyuency (3 MHz to 30 MHz) hipot high-otential HV high voltage Hz Hel'tz IA instrument amplifier IC integrated circuit ICE in-circuit emulator IEC International Electrotechnical Commission IEEE Institute of Electrical and Electronics Engineers IES Institute of Environmental Sciences IF intermediate frequency IFT inverse fast Fourier transform IIR infinite impulse response (filter) IMD intermodulation distortion INL integral nonlinearity Y0 input/output IPC InstituteInterconnecting and Packaging Electronic Circuit IR infrared radiation IRQ interruptrequest ISA (1) Instrument Society of America (2) Industry Standard Architecture (PC bus) ISDN integrated services digital network ISHM International Society for HybridMicroelectronics ISO International Organization for Standardization JEDEC Joint Electronic Device Engineering Council JTAG Joint Test Action Group KGD known-good die laser light amplification by stimulated emission of radiation LCC leadless chip carrier LCD liquid crystal display LED light-emitting diode LF low frequency (30 kHz to 300 kHz) LRU line replaceable unit LSB least significant bit LSI large-scale integration LSSD level-sensitive scan design LUT look-uptable MCC 1Llicroelectronics and Computer Technology Corporation (formerly Microelectronics and Computer Consortium) MCM multichip module MDA manufacturing-defects analyzer MFP mini flat pack MMI man-machine interface MMIC monolithic microwave integrated circuit MOSFET metal-oxide semiconductor field-effect transistor MPEG Moving Picture Experts Group R€IPU microprocessor unit MSB most significant bit MSI medium-scale integration MSK minimum-shift keying MTBF mean time between failures IMTTR mean time to repair MUX multiplexer MXI multiplatform extension for instrumentation NEMA National Electrical Manufacturers Association NEP noise equivalent power NIST National Institute of Standards and Technology NMRR normal-mode rejection ratio NRE nonrecuning engineering NRZ nonreturn to zero NVLAP National Voluntary Laboratory Accreditation Program OEM original equipment manufacturer OQPSK offset-quadrature phase-shift keying 0S operating system OTDR optical time-domain reflectometer PCB printed circuit board PCBA printed circuit board assembly PCI Peripheral Component Interconnect PCMCIA Personal Computer Memory Card Interna-tional Association PDEF physical design exchange format PDH plesiochronous-digital hierarchy FF power factor PGA pin-grid array PID proportional integral-differentia1 PLCC plastic leadless chip carrier PLD programmable logic device PLL phase-locked loop POTS plain old telephone service P€P peak to peak PQFP plastic quad flat pack PRF pulse repetition frequency PRN pseudorandom noise PS power spectrum PSD power spectral density PSTN public switched telephone network PWB printed wiring board PWBA printed wiring board assembly PWM pulse-width modulation &A quality assurance QAIM quadrature amplitude modulation QC quality control QML qualified manufacturers list QPL qualified part (or product) list QPSK quadrature phase-shift keying QTAG Quality Test Action Group RAM random access memory RC resistor-capacitor RCVR receiver RF radio frequency RFI radio-frequency interference RGB red-green-blue R€S root mean square ROM read-only memory 1) real time 2) risetime EtTD resistance temperature device ItTOS real-time operating system WI€S request to send SA spectrum analyzer SEC single-board computer SCPI Standard Commands Programmable Instruments (IEEE 488.2) SCSI Small Computer Standard Interface SDH synchronous digital hierarchy SDLC synchronous data link control SECAM sequential color and memory SEn€l scanning electron microscope SEMI Semiconductor Equipment and Material International Ass SFDR spurious-free dynamic range S/H sample and hold SHA sample-and-hold amplifier SIR Semiconductor Industry Association SID Society for Information Display SIM1M single in-line memory module SINAD signal-to-noise-and-distortion ratio SIP single in-line package SLAM scanning laser acoustic microscope SLIC subscriber-line interface circuit SMART stress marginality and accelerated reliabilitytesting SMD surface-mount device SMT surface-mount technology SNR signal-to-noise ratio SOIC small-outline integrated circuit SONET synchronous optical network SOT small-outline transistor SPC statistical process control SPICE simulation program with integrated circuitemphasis SPM scanning-probe microscope sps samples per second SQC statistical quality control SQFP shrink quad flat pack SQPSK staggered quadrature phase-shift keying SRAM static random-access memory SSB single sideband SSOP shrink small-outline package STEIM scanning transmission electron microscope STP shielded twisted pair STRIFE stress and life SWEAT standard wafer-level electromigration acceler-ated test swR standing wave ratio TAB tape automated bonding TBGA tape ball-grid array TC 1) temperature coefficient 2)thermocouple TCO total cost of ownership TCP/IP transmissioncontrolprotocoUInternet protocol TDIM time division multiplexer TDR time-domain relectometer TE€ 1) transverse electromagnetic mode 2) transmission electron microscope T/H track and hold THD total harmonic distortion TIA Telecommunications Industry Association TISSS Tester Independent Software Support System ADC analog-to-tligital conver€ter ADPCM adaptive differential pulse-code modulation AFC automatic frequency control AGC automatic gain control AHDL analog hardware descriptive language AMLCD active-matrix liquid crystal display ANSI American National Standards Institute AOI automated optical inspection AQL acceptable quality level ARET accelerated l€eliability enhancement testing ARINC Aeronautical Radio Inc. ASCII American (National) Standard Code for Information Interchange ASQC Amel€ican Society of Quality Control ATE automatic test equipment ATG autornatic test generation ATM asynchponous transfer mode ATPG automatic test program (or pattern) generator AWG l)American wire gauge 2) arbitrary waveform generator balun balanced-to-unbalanced transformer BDD binary decision diagram BER bit error rate BERT bit error rate tester BGA ball-grid array B-ISDN broadband inteffrated sey€vices digital network BIST built-in self-test BIT built-in test BITE built-in test equipment BNC baby "N" connector BPSK binary phase-shift keying BS boundary scan BSDL Boundary-Scan Description Language CAD computer-aided design CAE computer-aided engineering CAMAC I computer-automatecl measurement and control CAT computer-aided test CCD charge-coupled device CCITT I Consultative Committee on International Telephone and Telegraph CDMA I code division multiple access CFC 1) current-to-frequency converter 2) chlorofluorocarbon CIIL Common Instrument (Control Intermediate) Interface Lang CMR common-mode rejection CMRR common-mode rejection ratio CMV common-mode voltage CMVR common-mode voltage ratio CODEC coder-decoder COTS commercial off-the-shelf cps cycles per second CPS characters per second CPU central processing unit CRC c3iclic redundancy check CSMA/CD carrier sense multiple access/collision detection CW continuous wave D/A digital-to-analog DAC tliRital-to-analog converter DAQ data acyuisition DAS data-accluisition system dB decibel dBm clK power(l mW into a 600-€lload) DBPSK differential-binary phase-shift keying DC direct current DCE tlata communications eyuipment DCT discrete cosine transform DDE dynamic data exchange DDS direct digital synthesis DFM clesiffn for manufacturability DFT 1) desiffn for test 2) tliscrete Fourier transform DIN Deutsche Industrie Normenausschuss German standards agency) DIG digital input/output DIP dual in-line package DLL dynamic link library DMA direct memory access DMM dig€ital multimeter DNL differential nonlinearity DPM digital panel meter DQPSK differential quadrature phase-shift keying DRAM dynamic random access memory DSO digital sampling (or storage) oscilloscope DSP diffital signal processoy€ (or processing) DTE data terminal equipment DTMF dual-tone multiple fi€eyuency DUT device under test DVM digital voltmeter EDA electronic design automation EDIF Electronic Design Interchange Format ELA Electronic Industries Association EISA extended industry standard architecture (PC bus) EMC electromagnetic compatibility EMF electromagnetic field EMI electromagnetic interference EMF electromagnetic pulse E0 electro-optical, electro-optic EPLD erasable pl-offrammable logic device EPROM erasable pl€ogrammable read-only memory ESD electrostatic discharge ESDA electronic system design automation ESR equivalent series resistance ESS 1) environmental stress screening 2) electianic switching system ETS equivalent time sampling EUT equipment under test FCC Federal Communications Commission FDDI fiber distributed data interface FDMA frequency-division multiple access FET field-effect transistop FFT fast Fourier transform FIFO first-in,first-out FIR finite impulse response (filter) FIT 1) fault isolation test 2) failures in time (testing-) FM frequency modulation FPGA field-progr€ammable gate array FS full scale FSK frequency-shift keying FN frequency-to-voltaffe FTP File €ansfer Protocol(Internet) GFSK Gaussian fr€eyuency-shift keying GIF graphic image file GRISK Gaussian-filtered minimum-shift keying GPIB general purpose interface bus GPS Global Positioning S;ystem GSM Groupe Speciale Mobile (or Global System for Mobile ('ommunications) GUI graphical user interface HALT highly' accelerated life test HASS highly accelerated stress screening HAST highly accelerated stress test HBM human body model HF high heyuency (3 MHz to 30 MHz) hipot high-potential HV high voltage Hz Hertz IA instrument amplifier IC integrated circuit ICE in-circuit emulator IEC International Electrotechnical Commission IEEE Institute of Electrical and Electronics Engineers IES Institute of Environmental Sciences IF intermediate frequency IFT inverse fast Fourier transform IIR infinite impulse response (filter) IMD intermodulation distortion INL integral nonlinearity I/0 input/output IPC Institute Interconnecting and Packaging Electr Circuits IR infrared radiation IRQ interruptrequest ISA 1) Instrument Society of America 2) Industry Standard Architecture (PC bus) ISDN integrated services digital network ISHM International Society for Hybrid Microelectronics ISO International Organization for Standardization JEDEC Joint Electronic Device Engineering Council JTAG Joint Test Action Group KGD known-good die laser light amplification by stimulated emission of radiation LCC leadless chip carrier LCD liquid crystal display LED light-emitting diode LF low frequency (30 kHz to 300 kHz) LRU line replaceable unit LSB least significant bit LSI large-scale integration LSSD level-sensitive scan design LUT look-uptable MCC Microelectronics and Computer Technology Corporation (formerly Microelectronics and Computer Consortium) MCM multichip module MDA manufacturing-defects analyzer MFP mini flat pack MMI man-machine interface MMIC monolithic microwave integrated circuit MOSFET metal-oxide semiconductor field-effect transistor MPEG Moving Picture Experts Group MPU microprocessor unit MSB most significant bit MSI medium-scale integration MSK minimum-shift keying MTBF mean time between failures MTTR mean time to repair MUX multiplexer MXI multiplatform extension for instrumentation NEMA National Electrical Manufacturers Association NEP noise equivalent power NIST National Institute of Standards and Technology NMRR normal-mode rejection ratio NRE nonrecuning engineering NRZ nonreturn to zero NVLAP National Voluntary Laboratory Accreditation Program OEM original equipment manufacturer OQPSK offset-quadrature phase-shift keying 0S operating system OTDR optical time-domain reflectometer PCB printed circuit board PCBA printed circuit board assembly PCI Peripheral Component Interconnect PCMCIA Personal Computer Memory Card International Association PDEF physical design exchange format PDH plesiochronous-digital hierarchy FF power factor PGA pin-grid array PID proportional integral-differentia1 PLCC plastic leadless chip carrier PLD programmable logic device PLL phase-locked loop POTS plain old telephone service p-p peak to peak PQFP plastic quad flat pack PRF pulse repetition frequency PRN pseudorandom noise PS power spectrum PSD power spectral density PSTN public switched telephone network PWB printed wiring board PWBA printed wiring board assembly PWM pulse-width modulation QA quality assurance QAM quadrature amplitude modulation QC quality control QML qualified manufacturers list QPL qualified part (or product) list QPSK quadrature phase-shift keying QTAG Quality Test Action Group RAM random access memory RC resistor-capacitor RCVR receiver RF radio frequency RFI radio-frequency interference RGB red-green-blue RMS root mean square ROM read-only memory RT 1) real time 1 2) risetime RTD 1 resistance temperature device RTOS 1 real-time operating system RTS 1 request to send SA spectrum analyzer SEC single-board computer SCPI Standard Commands ProgrammableInstruments (IEEE 488.2) SCSI Small Computer Standard Interface SDH synchronous digital hierarchy SDLC synchronous data link control SECAM sequential color and memory SEM scanning electron microscope SEMI Semiconductor Equipment and Material Inte Association SFDR spurious-free dynamic range S/H sample and hold SHA sample-and-hold amplifier SIR Semiconductor Industry Association SID Society for Information Display SIMM single in-line memory module SINAD signal-to-noise-and-distortion ratio SIP single in-line package SLAM scanning laser acoustic microscope SLIC subscriber-line interface circuit SMART stress marginality and accelerated reliability testing SMD surface-mount device SMT surface-mount technology SNR signal-to-noise ratio SOIC small-outline integrated circuit SONET synchronous optical network SOT small-outline transistor SPC statistical process control SPICE simulation program with integrated circuit emphasis SPM scanning-probe microscope sps samples per second SQC statistical quality control SQFP shrink quad flat pack SQPSK staggered quadrature phase-shift keying SRAM static random-access memory SSB single sideband SSOP shrink small-outline package STEIM scanning transmission electron microscope STP shielded twisted pair STRIFE stress and life SWEAT standard wafer-level electromigration accelerated test SWR standing wave ratio TAB tape automated bonding TBGA tape ball-grid array TC 1) temperature coefficient 2)thermocouple TCO total cost of ownership TCP/IP transmissioncontrolprotocoUInternet protocol TDM time division multiplexer TDR time-domain relectometer TEM 1) transverse electromagnetic mode 2) transmission electron microscope T/H track and hold THD total harmonic distortion TIA Telecommunications Industry Association TISSS Tester Independent Software Support System TPQFP test-pad quad flat pack TQFP thin quad flat pack TQM total quality management TSOP thin small-outline package TTL transistor-transistorlogic TTY teletypewriter TUR test uncertainty ratio TUV Technische Uberwachungs-Verein German test lab) UHF ultra-high frequency (300 MHz to 3 GHz) UL Underwriters Laboratories UPS uninterruptible power supply UTP unshielded twisted pair UUT unit under test W ultraviolet VA volt-ampere VAC volts alternating current VAR 1) volt-ampere reactive 2) value-added reseller VB Visual Basic (software) VEX Visual Basic extension VCO voltage-controlled oscillator VDC volts direct current VFC voltage-to-frequency converter VHDL VHSIC Hardware Description Language VHF verv hi€h freauencv (30 kHz to 300 MHz€ VHSIC very high speed integrated circuit VISA Virtual Instrument Software Architecture VLF very low frequency (below 30 kHz) VLSI very large-scale integration VMEbus versatile modular E-bus (formerly VersaModule, European) Vp-p peak to peak voltage VSOP very small outline package VSWR voltage standing-wave ratio VTVM vacuum tube voltmeter VXIbus VMEbus extension for instrumentation XMTR transmitter ZIF zero-insertion-force AAM Area Administrative Manager ABC Activity Based Costing ABD America's Business Div, domestic regional business center ABIC Advanced Bi-CMOS ABM Activity Based Managememt ABP Advanced Bus Products. ABS Anti-lock Braking System ABT Advanced BiCMOS TTL, mix variable by vendor AC Advanced CMOS with CMOS-level input threshold ACA Assigned Corporate Account ACC Accumulator Accuracy Control Character ACCORD Automated Customer Communications Real-time Debits ACL Advanced CMOS Logic, TI's version of FACT ACLV AutoCLaVe (REL test) ACM Association for Computing Machinery ACMOS Advanced CMOS ACQ FACT Quiet Series with CMOS-level input threshold ACT Advanced CMOS with TTL-level input threshold (NOT bipolar) ACTQ FACT Quiet Series CMOS-level input threshold (NOT bipolar) ACU Airborne Control Unit AD Area Director ADAM Assigned Distributor Account ADC Analog to Digital Controller ADP Automatic Data Processing ADSM Area Distributor Sales Manager AES Auger Electron Spectroscopy AF Audio Frequency AI Artificial Intelligence ALIC Advanced Linear Integrated Circuit ALR Assembly Level Reliability ALS Advanced Low Power Schottky Logic AMG Alternating Metal Ground AMHS Automated Material Handling Systems AMM After Market Manufacturer AMR Automated remote Meter Reading AND Advanced Network Devices ANSI American National Standard Institute AOP Annual Operating Plan, superseded by SBP1 AOPU Annual Operating Plan Update, superseded by SBP2 AOQL Average Outgoing Quality Level AP Asia Pacific APL Approved Product List APICS American Production and Inventory Control Society APM Advanced Power Management APPG Automatic Pad Placement Generator APQ All Parts Qualified (date) AQL Acceptance Quality Level AQP Advance Quality Planning ARAM Audio RAM (defective DRAM) AP/PO Accounts Payable/Purchase Order ARO After Receipt of Order ARP Address Resolution Protocol AS Advanced Schottky ASAP As Soon As Possible ASCII American Standard code for Information Interchange ASD Analog Software Development; Analytical Software Dev ASIC Application Specific Integrated Circuit ASIM Application Specific Integrated Module ASIP Advanced System and Interface Product ASN Advanced Shipping Notice ASP Average Selling Price ASPC Automated Semiconductor Planning and Control ASQC American Society for Quality Control ASSP Application Specific Standard Parts ASSY ASSemblY ATE Automated Test Equipment ATM Area Technical Manager ATS Available To Sell ATSP Application Targeted System Prod AT&T Quality Registrar AVI Audio Video Interleaved AWB AirWayBill AWS Alternative Work Schedule B/L Backlog BASIC Beginners All-purpose Symbolic Instruction Code BBS Bulletin Board System BC Business Center BCAE Business Center Applications Engineer BCD Binary Coded Decimal BCM Business Center Manager BCME Business Center Marketing Engineer BCP Biphase Communications Processor BCT BiCMOS TTL, mix of bipolar and CMOS depends on vendor BCU Business Center Unit BE Break Even BEM Building Emergency Manager BI Burn-In BIC Best In Class BiCMOS Part Bipolar, Part CMOS, percent mix variable BiFET Bipolar Field Effect Transistor BIOS Basic Input/Output BIST Built In Self Test BOE Buffered Oxide Etch BOF Business Opportunity Forecast BOM Business Office Manager BP Business Planning BPP Biased Pressure Pot = Biased ACLV BPS Bit Per Second BPSG Boron Phosphor Silicate Glass BS Build Sheet BUM Business Unit Manager BTL Backplane Transceiver Logic, bipolar process BTW By The Way CA Corrective Action CAC Career Action Center CAD Computer Aided Design CAE Computer Aided Engineering CAI Computer Aided Instruction CAM Computer Aided Manufacturing CAM Content Addressable Memory CAN Car Area Network CAPS Commute Alternative Program System CAO Chief Administrative Officer CASE Computer-aided Software Engineering CAT Corporate Action Team (to analyze Employee Survey Results) CATV Cable Television C & C Communications and Computing (Division) C&T Computing & Telecommunications CBD Coefficient of Bureaucratic Drag CBI Critical Business Issue CBS Corporate Business Systems CBT Computer Based Testing C of C Certificate of Compliance CCD Charge Coupled Device CCG Communications and Computing Group CCIM Corporate CIM CCM Configurable Controller Methodology CCV Closed Circuit Voltage CD Collision Detection CDA Clean Dry Air; Corporate Design Automation CDE Common Design Environment CDF Customer Drawing File CDI Compact Disk Interactive CDROM Compact Disc Read Only Memory CEG Computer Enchancement Group CEO Chief Executive Officer C & F Cost and Freight CFAP Customer Forecasting Automation Process CFO Chief Financial Officer CGI Common Gateway Interface CHD Corporate Help Desk CHIPS Center for Health Improvement and Personal Success CIA Cash In Advance CIF Cost, Insurance and Freight CIM Computer Integrated Manufacturer CIRM Certification in Integrated Resource Management CIS Contact Image Sensor CISC Complex Instruction Set Computing CLASIC Custom Linear ASIC CLAY Configureable Logic Array CLD Custom Logic Device CLIC Consumer Linear Integrated Circuit ( NSC product group) CM Configuration Management CMF Customer Master File CMIP Common Management Information Protocol CMOS Complimentary Metal Oxide Silicon CMR Customer Material Return CMS Conversational Monitor System CMYK Cyan-Magenta_Yellow_Key (usually black) CODEC COmpressor/DECompressor COMETS Comprehensive On-line Manu Engineering Tracking System COO Chief Operations Officer COP Calculator On Processor COS Cost Of Sales COT Customer Owned Tooling CP Control Program CPC Central Production Control CPD Power Dissipation Capacitance CPE Customer Premise Equipment CPK Process Capability Index CPL Certified Parts List; Customer Product List CPM Critical Path Method; Corporate Product Manager CPN Customer Part Number CPR Continued Processing Request CPS Corporate Planning System; Customer Profile System CPU Central Processing Unit CQF Customer Qualification Form CRC Customer Response Center CRD Customer Return Debits; Customer Request Date CRS Capacity Reservation System; Channel Reservation System CRT Cathode Ray Tube CS Customer Service CSC Customer Support Center CSD Contract Sales Debits; Current Schedule Date CSMA Carrier Sense Multiple Access CSMA/CD Carrier Sense Multiple Access and Collision Detection CSP Contract Sales Price; Customer Specific Product CSTF Corporate Strategy Task Force CT Cold Test; Cycle Time; Computer Tomography ( CAT) CTC Career Transition Center CTG Corporate Technology Group CTM Customer CTP Customer Tooled Products; CustomTechnologies & Products CUBA CUstomer Base Analysis CTO Chief Technical Officer CY Calendar Year CYA Cover Your Assets CVD Chemical Vapor Deposition CVP Cooperative Vendor Program DA Design Automation DAC Digital to Analog Converter DAM Digital Answering Machine DARPA Defense Advanced Research Projects Agency (US government) DAS Device Analysis Services; Data Acquisition System DASK Digital Implementation for Amplitude Shift Keying DAT Digital Audio Tape DBI Database Interface DBU Distribution Business Unit DCE Data Communication Equipment DCF Document Composition Facility DD Defect Density DDI Direct Data Interface DDS Device Detail Sheet DE Design Engineering DEC Digital Equipment Corporation DECT Digital European Cordless Telecommunications DESC Defense Electronic Supply Commission DFT Design For Test DHTL Dynamic High Temp. Life (OPL) DI Develop Inspect DLM Dual Layer Metal DIP Dual In-line Package DIW Distributed Inside Wire DMA Direct Memory Access DMD Data Management Group DNA Digital Network Architecture DNI SunMicrosystem DECnet-compatible products DNR Dynamic Noise Reduction DOA Dead On Arrival DOD Department Of Defense (US government) DOE Design Of Experiments DOS Disk Operating System for personal computer DP Data Processing DPI Data Processing Interface DPS Desktop Personal Systems DPW Die Per Wafer DRAM Dynamic Random Access Memory DRC Design Rules Check DSM Distributor Sales Manager DS Data Sheet; Development System DSO Distributor Sales Out (resales) DSP Digital Signal Processor DTAM Distribution Total Available Market DTE Data Terminal Equipment DTP Data grade unshielded Twisted Pair; Data TransProducts DTP Desk Top Publishing DUT Device Under Test DWF Die in Wafer Form EAO European Automotive Operations EAP Employee Assistance Program EB East Bangkok assembly & test facility EBIC Electron Beam Induced Current EBS Electronic Build Sheet EC&I Embedded Controllers & Imaging ECC Engineering Computer Center ECD Embedded Control Division ECG Embedded Control Group ECL Emitter-Coupled Logic, bipolar process ECLIPS Motorola's Advanced ECL ECN Engineering Change Notice EDA Electronic Design Automation EDB Engineering Data Base EDI Electronic Data Interchange EDIF Electronic Data Interchange Format EDN Electronic Design News EDP Electronic Data Processing EDS Energy Dispersive Spectroscopy EDX Energy Dispersive X_ray Spectroscopy EEPROM Electronically Eraseable Programmable Read Only Memory EF Early Failure EFR Early Failure Rate EI Environmental Improvement EIA Electronics Industries Association EIAJ Electronics Industries Association of Japan EISA Electronics Industry Standard Architecture ELF Extremely Low Frequency EM Mallaca, Malaysia; ElectroMigration EMAIL Electronic Mail EMC ElectroMagnetic Compatibility EMI Electromagnetic Interference EMS Emission Microscope System EMU EMUlator EOF End Of Field EOL End of Life; End of Line EON Engineering Order Number EOS Electrical OverStress EP EndPoint EPROM Eraseable Programmable Read Only Memory EPS Earnings Per Share EPU Evaluation and Programming Unit EQR Electronic Industries Quality Registrar ERC Engineering Response Center ERDM Electronic Reliability Data Management ESA Enterprise Systems Architecture ESCA Electron Spectroscopy for Chemical Analysis ESD Electro Static Discharge; Embedded Systems Division ERT Emergency Response Team ESF Executive Strategic Forum ESS Environmental Stress Screening ET Electric Test (before WS) ETA Estimated Time of Arrival ETD Estimated Time of Departure ETS Educational Testing Society EUR EURope F100K Fairchild 100K ECL Logic FA Failure Analysis FAB FABrication (Plant) FACT Fairchild Advanced CMOS Technology FAE Field Applications Engineer FAQ Frequently Asked Question FASB Financial Accounting Standards Board FAT Functionality Application Test FAX Facsimile FCC Federal Communications Commission FCS Frame Check Sequence FCST ForeCaST FCT FAST CMOS with TTL-level input threshold (NOT bipolar) FCTA Higher speed version of FCT FCTB AMD29c8xx equivalent FCT FDC Floppy Disk Controller FDDI Fiber Distributed Data Interface FEA Finite Element Analysis FEP Front End Processor FET Field Effect Transistor FFF Form, Fit, and Function FIBS Focused Ion Beam System FIFO First in First Out FISH First In, Still Here FIT Failures In Time per billion operating device-hours) FLA Four Letter Acronym; Five Letter Acronym FMC Field Marketing Center; Fixed Manufacturing Costs FMEA Failure Mode Effect Analysis FMM Field Marketing Manager FOB Free On Board FOX Field OXide FPA Floating Point Accelerator FPLA Field Programmable Logic Array FRC Fairchild Research Center FRP Fast Reaction Program FRU Field Replaceable Unit FS Field Sales FSE Field Sales Engineer FT Final Test; Fast Test; Feed Through FTA Field Target Account FTP File Transfer Protocol FUD Fear, Uncertainty, Doubt FY Fiscal Year FYA For Your Amusement FYI For Your Information G&A General and Administrative GAAP Generally Accepted Accounting Principles GaAS Galluim Arsenide GAL General Array Logic GDW Gross Die per Wafer GE GErmany GIC Guaranteed Investment Contract GIGO Garbage In, Garbage Out GIF Graphic Interchange Format GIP Group Incentive Plan GL General Ledger GLT Guaranteed Lead Time GM Gross Margin GMC Global Marketing Council GML Generalized Markup Language GNP Gross National Product GOP Gross Operating Profit GOS Gate Oxide Short GP Gross Profit GPIB General Purpose Instrument Bus GPM Gross Profit Margin GPO General Post Office GT Greater Than GTO Gradual Turn-On (circuit for reducing ground bounce) GUI Graphical User Interface GV Geometry Verification HAST Highly Accelerated Stress Test HAWB House AirWayBill HC High-speed CMOS with CMOS-level input threshold HCMOS High-speed CMOS HCT High-speed CMOS with TTL-level input thresh(NOTbipolar) HDL High Level Design Language HDTV High Definition Television HLL High Level Language HMMP Hazardous Material Management Plan HP Hewlett Packard HPC High Performance Controller; High Performance Contacts HPS High Performance System HR Human Resources HRD Human Resource Development HT Hot Test HTH Hope This Helps HTML HyperText Markup Language HTRB High Temperature Reverse Bias HTSL High Temperature Storage Life HTTP HperText Transport Protocol HV High Voltage HVAC Heating, Venting, and Air Conditioning; High Voltage AC Current HW HardWare IBE International Business Element IBEM Intermediate Business Element Manager IBG International Business Group IBM International Business Machines IBR International Business Review IC Integrated Circuit ICC Power Supply Current ICCD Dynamic Power Dissipation Current (given in mA/MHz) ICCT Additional ICC (IDD) due to CMOS input at TTL level ICMP Internet Control Message Protocol ICR Intelligent Character Recognition ICT In-Circuit Tester ICU Intensive Care Unit IDB Integrated Database IDD Power Supply Current (MOS) IDE Integrated Drive Electronics IDS Integrated Diagnostic System IEE Power Supply Current ECL IEEE Institute of Electrical and Electronic Engineers I/F Interface IIH Input Current High IIL Input Current Low IIN Input Leakage Current(if IIH=IIL) IIT Integrated Information Technology ILD Inner Layer Dielectric IMHO In My Humble Opinion IMNSHO In My NOT SO Humble Opinion INN InterNational News IO Input-Output IOH Output Current High IOHD Dynamic IOH (used ti guarantee CMOS line driving) IOL Output Current Low IOLD Dynamic IOL (used to guarantee CMOS line driving) IOS Output Short Circuit Current IOZ Output Current Tristate IOZT I/O Current Tristate for Transceiver IP Internet Protocol IPG Innovative Products Group IR InfraRed IrDA Infrared Data Association IRQ Interrupt Request Line IRR Internal Rate of Return IS Information Systems ISA Internal Sales Administrator ISDN Integrated Services Digital Network ISE In System Emulator ISG Information Systems Group ISIR Initial Sample Information Report ISO International Standards Organization ISP Internet Service Provider I/T In Transit ITR Inspection Trouble Report IVHS Intelligent Vehicle Highway System JANS Joint Army Navy Space JAP JAPan JEDEC Joint Electrical Defense Engineering Council JETAG Joint European Test Action Group JFET Junction Field Effect Transistor JIT Just In Time JMI Johnson Matthey Incorporated JPEG Joint Photographic Experts Group JV Journal Voucher KEIP Key Employee Incentive Program KGD Known Good Die LA Lot Acceptance LAN Local Area Network LAT Lot Acceptance Test LC Letter of Credit LCC Leadless Chip Carrier = LLCC LCD Liquid Crystal Display LD LeaD LDCC LeaDed Chip Carrier LDO Low-Dropout Regulator LED Light Emitting Diode LERIC Lite Repeater Interface Controller LIFO Last In, First Out LLC Logical Link Control LLCC LeadLess Chip Carrier LNA Low Noise Amplifier LOA Leave Of Absence LOTS Lot Order Tracking System (tracks WIP) LP Late Programming LPCVD Low Pressure CVD LRT Lab Resource Team LSB Least Significant Bit LS/LPS Low Power Schottky Logic LSI Large Scale Integration L/T LeadTime LT Long Term; Less Than LTO Low Temperature Oxide LVS Layout Versus Schematic MA Market Analysis MAC Media Access Control MACSI Media Access Controller and System Interface MAN Metropolitan Area Network MAPL Multiple Array Programmable Logic MARCOMM MARketing COMMunications MAU Multi-station Access Unit MAWB Master AirWayBill MBA Master of Business Administration MBO Management By Objectives MBNQA Malcolm Baldridge National Quality Award MBPS Megabits Per Second MBWA Management By Walking Around MCA Micro Channel Architecture MCC Microelectronics and Computing Consortium MCP Multi-Chip Package MCR Materials Characterization Repository MCT Micro Component Technology MECL Motorola ECL MER Material Engineering Requisition M&L Materials & Logistics MET Master Edit Table MFG ManuFacturinG MFM Major Failure Mode MH Midgel Haemek MILAERO MILitary, AEROspace MIME Multipurpose Internet Mail Extension MIPS Million Instructions Per Second MIR Managing Interpersonal Relationships MIS Management Information System MIWU Multi-Input WakeUp MMU Memory Management Unit MOLE Microcontroller On-Line Emulator MORE Migrate Onwards to Real Expectations MOS Metal-Oxide-Silicon, type of transistor structure MOSFET Metal-Oxide-Silicon Field Effect Transistor MPEG Motion Picture Experts Group MPD Memory Products Division MPL Master Price Lis